JTX1N414P
Semiconductor Devices and Associated Hardware
SEMICONDUCTOR DEVICE,DIODE
JTX1N414P
5961 - Semiconductor Devices and Associated Hardware
Texas Instruments Incorporated
SEMICONDUCTOR DEVICE,DIODE
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Technical Characteristics
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                                    Test Data Document81349-mil-s-19500 specification (includes engineering type bulletins, brochures,etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general type 
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                                    Terminal Length1.000 inches minimum and 1.500 inches maximum 
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                                    Overall Diameter0.056 inches minimum and 0.075 inches maximum 
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                                    Spec/Std Controlling Data
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                                    Definitive Government Spec/Std Referencejantx1n4148 
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                                    Specification/Standard Data81349-mil-s-19500/116 government specification 
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                                    Terminal Type And Quantity2 uninsulated wire lead 
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                                    Mounting Methodterminal 
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                                    Inclosure Materialglass 
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                                    Manufacturers Code81349 
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                                    Semiconductor Materialsilicon 
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                                    Current Rating Per Characteristic500.00 milliamperes maximum peak forward surge current and 200.00 milliamperes maximum average forward current averaged over a full 60-hz cycle 
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                                    Maximum Operating Temp Per Measurement Point175.0 deg celsius ambient air 
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                                    Voltage Rating In Volts Per Characteristic100.0 maximum reverse breakdown voltage, dc 
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                                    Non-Definitive Government Spec/Std Referencemil-prf-19500/116 
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                                    Overall Length0.140 inches minimum and 0.180 inches maximum 
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                                    ~1data on certain environmental and performance requirements and test conditions that are shown as "typical", "average", "nominal", etc.). 
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