CWR04HD276KM

Technical Characteristics

• ~1

  data on certain environmental and performanc

• Test Data Document

  81349-mil-c-55365 specification (includes engineering type bulletins, brochures,etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general type

• Overall Length (Non-Core)

  0.320 inches nominal

• Reliability Failure Rate Level In Percent

  1.000

• Specification/Standard Data

  81349-mil-c-55365/2 government specification

• Body Style

  chip type

• Body Width

  0.180 inches nominal

• Case Material

  ceramic

• Dc Leakage At Maximum Operating Temp

  81.0 microamperes

• Body Height

  0.195 inches nominal

• Dc Leakage At Reference Temp

  8.100 microamperes

• Nonderated Operating Temp

  -55.0 deg celsius minimum and 85.0 deg celsius maximum

• Terminal Type And Quantity

  2 bonding pad

• Body Length

  0.320 inches nominal

• Reliability Indicator

  established

• Terminal Surface Treatment

  solder

• Overall Height (Non-Core)

  0.195 inches nominal

• Dissipation Factor At Reference Temp In Percent

  6.000

• Capacitance Value Per Section

  27.000 microfarads single section

• Tolerance Range Per Section

  -10.00/+10.00 percent single section

• Nonderated Continuous Voltage Rating And Type Per Section

  15.0 dc single section

• Terminal Length

  0.050 inches nominal

• Overall Width (Non-Core)

  0.180 inches nominal

• Capacitive Electrode Material

  tantalum

• Anode Type

  solid

• Schematic Diagram Designator

  no common or grounded electrode(s)

• Electrical Polarization

  polarized

• Center To Center Distance Between Terminals Parallel To Length

  0.220 inches nominal