635A817H02

Semiconductor Devices and Associated Hardware

SEMICONDUCTOR DEVICE,DIODE

635A817H02

5961-01-140-4766

5961 - Semiconductor Devices and Associated Hardware

Northrop Grumman Systems Corporation

SEMICONDUCTOR DEVICE,DIODE

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Technical Characteristics

  • Inclosure Material

    glass

  • Internal Configuration

    junction contact

  • Internal Junction Configuration

    pn

  • Features Provided

    hermetically sealed case

  • Semiconductor Material

    silicon

  • Voltage Rating In Volts Per Characteristic

    400.0 maximum repetitive peak reverse voltage

  • Voltage Tolerance In Percent

    -1.0 to 1.0

  • Current Rating Per Characteristic

    50.00 amperes maximum average forward current averaged over a full 60-hz cycle and 600.00 amperes maximum peak forward surge current

  • Maximum Operating Temp Per Measurement Point

    150.0 deg celsius junction

  • Terminal Type And Quantity

    1 tab, solder lug and 1 threaded stud

  • Overall Length

    1.474 inches nominal

  • Mounting Facility Quantity

    1

  • Mounting Method

    threaded stud

  • Overall Width Across Flats

    0.678 inches nominal

  • Nominal Thread Size

    0.250 inches

  • Thread Series Designator

    unf

Certified to
AS6081 Methods

Implementing Quality Procurement

A rigorous vendor selection process and vendor management system are essential to ensuring quality.
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Supplying Quality Products

We take every measure to ensure that we supply quality, authentic parts including a strict vendor selection process and rigorous product inspections..
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Providing Quality People

Our team of dedicated account managers, procurement professionals and specialized inspectors is the most valuable resource we have.
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