CWR11KC474KD

Technical Characteristics

• Test Data Document

  81349-mil-c-55365 specification (includes engineering type bulletins, brochures,etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general type

• ~1

  data on certain environmental and performanc

• Dc Leakage At Maximum Operating Temp

  5.0 microamperes

• Overall Height (Non-Core)

  1.8 millimeters maximum

• Body Width

  1.8 millimeters maximum

• Reliability Failure Rate Level In Percent

  0.001

• Equivalent Series Resistance At Reference Temp In Ohms

  18.00

• Reliability Indicator

  established

• Overall Width (Non-Core)

  1.6 millimeters nominal

• Dc Leakage At Reference Temp

  0.500 microamperes

• Terminal Surface Treatment

  solder

• Capacitance Value Per Section

  0.470 microfarads single section

• Overall Length (Non-Core)

  3.2 millimeters nominal

• Terminal Type And Quantity

  2 tab, solder lug

• Specification/Standard Data

  81349-mil-c-55365/8 government specification

• Nonderated Operating Temp

  -55.0 deg celsius minimum and 125.0 deg celsius maximum

• Tolerance Range Per Section

  -10.00/+10.00 percent single section

• Nonderated Continuous Voltage Rating And Type Per Section

  25.0 dc single section

• Body Height

  1.6 millimeters nominal

• Dissipation Factor At Reference Temp In Percent

  0.500

• Body Length

  3.2 millimeters nominal

• Capacitive Electrode Material

  tantalum

• Anode Type

  solid

• Schematic Diagram Designator

  no common or grounded electrode(s)

• Electrical Polarization

  polarized

• Body Style

  chip type

• Case Material

  ceramic