NSN: 5910-01-228-0569

Technical Characteristics

• Test Data Document

  81349-mil-c-55365 specification (includes engineering type bulletins, brochures,etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general type

• Electrical Polarization

  polarized

• Schematic Diagram Designator

  no common or grounded electrode(s)

• Anode Type

  solid

• Capacitive Electrode Material

  tantalum

• Dc Leakage At Maximum Operating Temp

  20.0 microamperes

• Reliability Failure Rate Level In Percent

  0.1000

• Overall Length (Non-Core)

  0.220 inches nominal

• Nonderated Continuous Voltage Rating And Type Per Section

  25.0 dc single section

• Tolerance Range Per Section

  -10.00/+10.00 percent single section

• Capacitance Value Per Section

  4.700 microfarads single section

• Dissipation Factor At Reference Temp In Percent

  6.0000

• Terminal Surface Treatment

  solder

• Reliability Indicator

  established

• Overall Height (Non-Core)

  0.070 inches nominal

• Body Height

  0.070 inches nominal

• Dc Leakage At Reference Temp

  2.000 microamperes

• Terminal Type And Quantity

  2 bonding pad

• Specification/Standard Data

  81349-mil-c-55365/4 government specification

• Nonderated Operating Temp

  -55.0 deg celsius minimum and 85.0 deg celsius maximum

• Precious Material And Location

  terminals gold

• Overall Width (Non-Core)

  0.135 inches nominal

• Case Material

  ceramic

• Body Style

  chip type

• Body Width

  0.135 inches nominal

• Body Length

  0.220 inches nominal

• Precious Material (Non-Core)

  gold

• Terminal Length

  0.030 inches nominal

• ~1

  data on certain environmental and performanc