NSN: 5961-00-927-5478

Semiconductor Devices and Associated Hardware

TRANSISTOR

5961 - Semiconductor Devices and Associated Hardware

TRANSISTOR

ACT NOW! SUBMIT A QUICK QUOTE.

Technical Characteristics

  • Mounting Method

    threaded stud

  • Overall Width Across Flats

    0.424 inches minimum and 0.437 inches maximum

  • Mounting Facility Quantity

    1

  • Overall Length

    1.230 inches maximum

  • Voltage Rating In Volts Per Characteristic

    80.0 maximum collector to emitter voltage/static/base open and 100.0 maximum collector to emitter voltage, dc with base short-circuited to emitter and 6.0 maximum emitter to base voltage, static, collector open

  • Current Rating Per Characteristic

    2.00 amperes source cutoff current maximum

  • Test Data Document

    22915-301962 drawing (this is the basic governing drawing, such as a contractor drawing, original equipment manufacturer drawing, etc.; excludes any specification, standard or other document that may be referenced in a basic governing drawing)

  • Internal Configuration

    junction contact

  • Special Features

    junction pattern arrangement: npn

  • Terminal Type And Quantity

    3 tab, solder lug

  • Features Provided

    hermetically sealed case

  • Power Rating Per Characteristic

    30.0 watts small-signal input power, common-collector absolute

  • Semiconductor Material

    silicon

  • Maximum Operating Temp Per Measurement Point

    200.0 deg celsius junction

  • Inclosure Material

    metal

Certified to
AS6081 Methods

Implementing Quality Procurement

A rigorous vendor selection process and vendor management system are essential to ensuring quality.
Read more...

Supplying Quality Products

We take every measure to ensure that we supply quality, authentic parts including a strict vendor selection process and rigorous product inspections..
Read more...

Providing Quality People

Our team of dedicated account managers, procurement professionals and specialized inspectors is the most valuable resource we have.
Read more...